Category: Materials characterization

Manufacturer; Model: BioLogic; VMP3

Short description: The VMP3 is a research-grade, multi-channel potentiostat/galvanostat installed with two impedance measurement modules and 15 independent channels, one of which is specifically designed for low current measurements. This equipment is especially useful in battery testing.

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Category: Materials characterization; Chemical laboratories and their equipment

Manufacturer; Model: Anton Paar; Litesizer 500

Short description: The LitesizerTM 500 can determine particle size, zeta potential and molecular mass by measuring dynamic (DLS), electrophoretic (ELS) and static light scattering (SLS), respectively. It can also measure the sample’s transmittance as well as refractive index.

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Category: Materials characterization 

Manufacturer; Model: SETARAM; LABSYS Evo

Short description: With LABSYS evo STA 1600 it is possible to analyse samples at temperatures as high as 1600°C. It is used to understand the thermal behaviour of materials that are exposed to extreme temperatures during their production, service, or recycling.

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Category: Microscopy; Materials characterization; Cleanrooms

Manufacturer; Model: Tescan Lyra

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Category: Microscopy; Materials characterization; Cleanrooms

Manufacturer; Model: Fei;Tecnai GF20

Short description: TEM Fei Tecnai G2 F20 is an electron microscope with the highest resolution in Latvia. Measurements with TEM provides high resolution information about the composition, structure and morphology of the sample.

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Category: Spectroscopy methods and lasers; Materials characterization 

Manufacturer; Model: Edinburgh Instruments; FLS1000-DD-stm

Short description: Spectrometer is intended for photoluminescence characterization. Emission spectra and excitation measurements can be conducted as well as quantum yield, absorbance and reflectance can be determined.

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Category: Materials characterization; Spectroscopy methods and lasers

Manufacturer; Model: Bruker; Equinox 55

Short description: Infrared Fourier Vacuum Spectrometer Bruker Equinox 55 offers FTIR analysis of the organic and inorganic materials, crystals, semiconductors, chemistry, biology, etc.

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Category: Spectroscopy methods and lasers; Materials characterization; Microscopy

Manufacturer; Model: Bruker; Vertex 80v

Short description: Infrared Fourier Vacuum Spectrometer Bruker VERTEX 80v offers FTIR analysis of the organic and inorganic materials, crystals, semiconductors, chemistry, biology, etc. Tool is equiped with Hyperion 2000 Infrared Microscope.

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Category: Materials characterization 

Manufacturer; Model: Hy-Energy; LLC PCTPro-2000, Mass Spectrometer RGAPro-100

Short description: Gas absorption measurements of various materials using Sievert type volume change method. New material, surface/volume adsorption studies and applications for energy. Nanomaterial and porous surface investigations.

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Category: Materials characterization 

Manufacturer; Model: Ecopia; HMS-5000

Short description: Tool offers characterization of various materials including all semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides, etc. and all measurements can be taken at varied temperature.

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Category: Materials characterization 

Manufacturer; Model: Agilent; G200

Short description: Tool provides micromechanical characterization of thin films and coatings, nanomaterials and surface layers of bulk materials.

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Category: Materials characterization; Spectroscopy methods and lasers 

Manufacturer; Model: Oxford Instruments; SM4000-8

Short description: Main application is investigations of luminescence mechanisms and nature of optical absorption bands via optically induced electron paramagnetic resonance (EPR).

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Category: Materials characterization 

Manufacturer; Model: Amatec; Dycor LC-D

Short description: Main applications are control and diagnostics of technological processes or applications making use of vacuum or controlled gas atmosphere vacuum leak detection.

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Category: Materials characterization; Chemical laboratories and their equipment 

Manufacturer; Model: Metrohm; 914 pH Meter/Conductometer

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Category: Materials characterization; Materials synthesis and treatment 

Manufacturer; Model: Metrohm Autolab; PGSTAT302N

Short description: Tool is purposed for galvanostatic and potentiostatic measurements for electrochemical systems such as electrochemical cells, batteries, or fuel cells.

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Category: Materials characterization; Cleanrooms; Microscopy

Manufacturer; Model: Various

Short description: Profiler is applicable to determination of transparent films/photoresist and other films thickness, thin- and thick-film measurements, toughness studies, surface quality and defect review.

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Category: Spectroscopy methods and lasers; Microscopy; Materials characterization

Manufacturer; Model: TriVista CRS Confocal Raman Microscope (TR777)

Short description: Measurements from Raman spectrometer offer identification and qualitative analysis of chemical structure of organic and inorganic materials.

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Category: Materials characterization

Manufacturer; Model: Rigaku; MiniFlex 600

Short description: MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction instrument. Offers information about the atomic structure and crystallinity of sample, phase identification, phase quantification, preferred orientation of phase in a film, etc. Tool is suitable for powders or samples with a flat plane.

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Category: Materials characterization

Manufacturer; Model: PANalytical; X'Pert Pro Powder

Short description: High resolution powder diffraction, phase identification and quantitative phase analysis, analysis of thin films and coatings, crystallite size and strain determination, kinetic and non-ambient experiments.

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Category: Materials characterization  

Manufacturer; Model: EDAX; Eagle III XPL

Short description: General application for express-analysis of elemental composition of different materials and devices. Compared to electron microscope-based XRF microanalyzers, no special sample preparation is required.

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Category: Materials characterization; Spectroscopy methods and lasers

Manufacturer; Model: ThermoFisher; ESCALAB Xi

Short description: XPS is a powerfull technique for characterization of chemical composition and chemical state of each element. Equipment offers not only XPS spectra acquisition but also surface and volume distribution analysis as well as more advanced techniques (UPS, EELS, etc.).

XPS ir spēcīgs instruments parauga ķīmiskā sastāva un ķīmiskā stāvokļa raksturošanai. Instruments dod iespēju ne tikai uzņemt XPS spektru, bet arī veikt virsmas un tilpuma sadalījuma analīzi kā arī advancētas metodes (UPS, EELS, u.c.).

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Category: Materials characterization; Spectroscopy methods and lasers

Manufacturer; Model: Sciencetech Inc.; SS150W

Short description: Solar simulator is a standard for solar panel illumination. It is equipped with a light source that has a spectrum similliar to the Sun spectrum. Test samples must comply the basic principles of construction of a solar cell with a size of 10x10 cm2. Tool is used in combination with a voltage source and electrometer.

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Category: Materials characterization

Manufacturer; Model: KP Technology SKP5050

Short description: Main applications are measurement of surface potential of organic compounds, determination of work function of metals and Fermi level of inorganic semiconductors

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Category: Materials characterization; Spectroscopy methods and lasers

Manufacturer; Model: J. A. Woollam Co., Inc.; RC2 - XI

Short description: An ellipsometer measures a change in polarization as light reflects or transmits from a material structure. Ellipsometry is primarily used to determine film thickness and optical constants, but it is also applied to characterise composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response. An ellipsometer can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biological coatings, and composites.

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Category: Materials characterization

Manufacturer; Model: Shimadzu Corp. - DTG-60

Short description: Main applications are determination of evaporation and condensation processes of substances, crystal existence, and the melting and crystallization temperature of crystal structures, softening temperature of amorphous substances.

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Category: Materials characterization; Spectroscopy methods and lasers 

Manufacturer; Model: Freiberg instruments - Lexsygresearch LMS

Short description: The main function of this tool is defect analysis from multiple physical phenomena: Thermostimulated luminescence (TSL); Optically stimulated luminescence (OSL); Cathodluminescence (CL); X-ray luminescence (XRL). In the tool sampels can be irradiated with x-rays, beta radiation and a UV laser. 

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Category: Materials characterization; Materials synthesis and treatment; Microscopy

Manufacturer; Model: Form Factor - MPS 1500

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