Microscopy; Materials characterization; Cleanrooms

Manufacturer and Model

Fei -Tecnai GF20


  • TEM point resolution 0.25 nm, line resolution 0.102 nm
  • Information limit 0.14 nm
  • Schottky field emitter with high maximum beam current (> 100 nA)
  • Energy spread 0.7 eV
  • Flexible high tension (20, 40, 80, 120,160, 200 kV and values in between)
  • Fully computer-controlled, eucentric side-entry
  • High stability CompuStage X, Y movement ± 1 mm, Z movement ± 0.375 mm
  • Specimen size 3 mm
  • EDS, SAED analysis

Applications and capabilities

TEM Fei Tecnai G2 F20 is an electron microscope with the highest resolution in Latvia. Measurements with TEM provides high resolution information about the composition, structure and morphology of the sample.
One of the main advantages of this tool is the option for sample rotation which looks at the sample from different angles and can create a 3D recontstruction.