Category
Materials characterization; Spectroscopy methods and lasers
Manufacturer and Model
J. A. Woollam Co., Inc. - RC2 - XI
Specifications
- Wavelength range: 210-1690 nm
- Max sample thickness: 18 mm
Applications and capabilities
An ellipsometer measures a change in polarization as light reflects or transmits from a material structure. Ellipsometry is primarily used to determine film thickness and optical constants, but it is also applied to characterise composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response. An ellipsometer can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biological coatings, and composites.