Category
Microscopy
Manufacturer and Model
Veeco - CP-II
Specifications
Imaging of surfaces using different SPM techniques
- Scanning area 100x100x7.5 µm
- Sample size: up to 10×10 mm
- Scanning by sample
- Manual XY stage 8×8 mm
- Motorized Z stage
- Optical microscope (20x) for tip and sample view
SPM Techniques:
- contact mode, tapping mode, force modulation mode
- scanning tunneling microscopy (STM)
- magnetic force microscopy (MFM)
- nanolithography by mechanical scratch
