Spectroscopic Ellipsometer WOOLLAM RC2
Ilze Aulika, Jeļena Butikova, Anatolijs Šarakovskis (ISSP UL).
This seminar will contain brief introduction about the new spectroscopic ellipsometer WOOLLAM RC2 available at ISSP UL.
Spectral Ellipsometry is an optical technique for thin film and multilayer characterization (optical constants – n&k, thickness, interface, roughness).
This ellipsometer provides characterization of nanomaterials, anisotropic thin films, samples with rough surface, graded samples or materials with voids. The light source has low power density – applicable to in vivo tissues.
The main topics of the seminar are:
- What is spectroscopic ellipsometry, its capabilities and limitations
- System overview, precision and aaccuracy of RC2 ellipsometer
- Which materials can be measured
- Parameters of interests achievable by ellipsometry
The seminar will be held in English.