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Phenom Pro – a desktop scanning electron microscope.

SEM-FIB Tescan Lyra XM – scanning electron microscope with energy dispersive x-ray fluorescence analysis and focused gallium ion beam (FIB) column.

TEM FEI Tecnai GF20 – transmission electron microscope for imaging and analysis in life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.

PANalytical X'Pert Pro powder diffractometer for high resolution powder diffraction, phase identification and quantitative phase analysis, analysis of thin films and coatings, crystallite size and strain determination

Nanoindenter G200 allows micromechanical characterization of thin films and coatings, nanomaterials and surface layers of bulk materials.

Veeco AFM CP-II allows visualization of nanostructures in materials science (surface morphology).

NT-MDT "SMENA" scanning probe microscope.

"Nanofinder S" 3D confocal microscope with spectrometer.

Nikon Eclipse L150 optical microscope with digital camera.