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Available analysis and characterization methods
Last Update
15.06.2016
  • Theoretical calculations and computer simulations using Latvian SuperCluster;
  • X-ray structural and X-ray absorption fine structure analysis;
  • Scanning electron microscopy (SEM), confocal optical microscopy in conjunction with Raman and luminescence spectroscopies and various scanning probe microscopies (AFM, STM, NSOM);
  • Fourier-transform infrared absorption spectroscopy, Raman spectroscopy, optical absorption spectroscopies in visible, ultraviolet and vacuum-ultraviolet ranges, a number of different luminescence spectroscopies and time resolved spectroscopy in picosecond time range with electron gun or pulsed laser excitation;
  • Electron paramagnetic resonance;
  • Electro-optic and non-linear optic methods and ellipsometry;
  • Holographic recording techniques;
  • Dielectric and photoconductivity measurements;
  • Cryogenic equipment within 10-600K for experiments at different temperatures.